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Probe Stations

150mm Probe Stations

The MPS150 is an easy to use, yet highly-precise manual probe platform for wafers and substrates up to 150 mm. Pre-configured application-focused probing solutions are available with everything you need to achieve accurate measurement results in the shortest time, with maximum confidence. The MPS150 is the industry’s probe platform of choice. â€‹

200mm Probe Stations

Whatever the application - device characterization, modeling, process development, design de-bug or IC failure analysis, Cascade Microtech's 200 mm wafer probing systems have the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices

300mm Probe Stations

Cascade Microtech 300 mm probing solutions set the standard for on-wafer test, delivering the precision and versatility needed to address a wide range of advanced, complex testing requirements​

PA200 Semi-automatic Probe System

The PA200 semi-automatic probe station relies on precision engineering to provide a stable environment for the most exacting applications​

Dedicated Measurement Systems

Integrated systems from Cascade Microtech provide a complete solution for complex measurement problems that cannot be solved with just a collection of piece parts. Each part of the integrated solution is optimized and fine tuned to work together, enabling fast accurate on-wafer data collection for complex application and measurement needs.​

SourceOne Certified Pre-owned Equipment

Cascade Microtech’s SourceOne program brings quality and industry-leading performance to the secondary equipment market. Whether you choose to purchase a reconditioned probe system or trade in your old equipment (or simply let us buy it back!) - Cascade Microtech will support you every step of the way, from order to installation​

Probe System Accessories

Precision measurement capability does not end with the probe and probe station. We offer a complete set of accessories to allow you to position, navigate, determine signal fidelity, and contact the wafer or device under test.

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