
PXI Systems

Compact, PXI-based Functional Tester for board and system level test
Preconfigured Functional Test Platform
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Preconfigured, cost effective, functional test solutions for analog, digital, mixed signal and avionics applications
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Core system includes a high density interface supporting card and box level products
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Compact platform - ideal for bench top test configurations
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PXI architecture accommodates both 3U and 6U modules
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Customizable test solutions without the custom price and delivery time
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3U/6U PXI Instrument

TS-305
Summation SigmaSeries Replacement System
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Digital input, output, and open collector digital output with memory
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Trigger / cross trigger bus
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High speed digital stimulus response w/memory
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Microprocessor ROM emulation
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6½ digit digital multimeter
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Function generator
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Universal counter/timer
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Scanner switching 2-pole
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Matrix switching
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Power Switching
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High performance 20 slot chassis
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TTI Testron Receiver
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6U PXI Instrument

TS-321 Series
GENASYS High Performance Mixed Signal Test System Platform
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PXI-based architecture offers compact footprint, open architecture, and expandability
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Hybrid and multiplexed pin capability supports testing of high value, mission critical products
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Scalable architecture supports up to 2304 switched interface test points
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Comprehensive tools for migrating LASAR based programs
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Ideal for upgrading / replacing legacy Teradyne L200/L300, GenRad 2750 and VXI-based systems

TS-323 Series
GENASYS High Performance Mixed Signal Test System Platform
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PXI-based architecture offers compact footprint, open architecture, and expandability
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Hybrid and multiplexed pin capability supports testing of high value, mission critical products
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Scalable architecture supports up to 4500 interface test points
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Comprehensive tools for migrating LASAR based programs
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Ideal for upgrading / replacing legacy Teradyne L200/L300, GenRad 2750 and VXI-based systems

Semiconductor test solutions for digital and mixed-signal test applications -TS-900 Series
PXI Semiconductor Test System
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PXI-based integrated semiconductor test platform
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20 slot 3U PXI chassis offers up to 512, digital I/O channels with PMU and timing per pin capability
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Application ready system offers a cost effective solution for digital and mixed-signal test applications
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Includes ICEasy test software tools - simplifying test creation and device characterization
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Multiple configurations - bench top, integrated cart, and integrated manipulator

Semiconductor test solutions for digital and mixed-signal test applications - TS-960 Series
PXI Semiconductor Test System with Timing per Pin Digital Subsystem
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PXI-based integrated semiconductor test platform
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20 slot 3U PXI chassis offers up to 512, digital I/O channels with PMU and timing per pin capability
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Application ready system offers a cost effective solution for digital and mixed-signal test applications
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Includes ICEasy test software tools - simplifying test creation and device characterization
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Bench top and integrated manipulator configurations

ATEasy
Test Executive And Development Studio
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Software development environment, and integrated, customizable Test Executive for execution, sequencing, debugging and fault analysis of tests
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Comprehensive simulation capabilities accelerates test program development and deployment
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User interface generation including form editor, event programming, menus, and controls
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Open architecture supports external software and hardware interfaces: DLL and C header files, .NET, ActiveX, LabView, Function Panel Drivers, IVI, GPIB, LXI (TCP/IP), VXI, USB, Serial and more
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Built-in Application Builder generates royalty-free run-time executables (exe files), and libraries (dll files)
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Cost-effective version (ATEasy-Lite) for OEM applications

Hardware Product Categorie - PXI
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CHASSIS AND CONTROLLERS
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DIGITAL I/O
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MEASUREMENT
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STIMULI
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FPGA
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SWITCHING
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POWER SUPPLIES
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BUS INTERFACES
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SPECIALTY
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PXI INSTRUMENTS
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LEGACY
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