In Circuit Testers

Key Features & Specifications

• Max node count : 5184

• Max channel count : 1152

• Footprint : 2.4 m x 0.8 m / 7.8’ x 2.6’

• Max no of modules : 4

Description

The E9903E i307x Series 5 has the largest nodes count coverage of the i3070 Series 5 family at 5184 nodes. The system includes the same Ease of use GUI on its predecessor, the E9903D i307x system. Since the launch of the first Series 1 3070 test system, decades ago, the Transportability, Reliability and Stability (TRS) is maintained including the capability to test at low voltages that are required with today’s components.

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Key Features & Specifications

• Max node count : 2592

• Max channel count : 576

• Footprint : 1.8 m x 0.8 m / 5.8’ x 2.6’

• Max no of modules : 2

Description

The E9902E i317x Series 5 system offers is designed to meet the needs of most mainstream electronics manufacturers seeking not only in-circuit test capability but additional test capability to ensure the highest test coverage for PCBAs. A two module option of the i3070 ideal for customers who require less node count capability.

Key Features & Specifications

• Max node count : 1296

• Max channel count : 288

• Max no of modules : 1

• Standard Footprint : 1.3 m x 0.8 m / 4.2’ x 2.6’

• E9901EL ‘Lean’ version footprint: 1.0 m x 0.8 m / 3.2’ x 2.6’ (25% footprint reduction)

Description

The E9901E i307x Series 5 offers just enough nodes for testing small boards in a small footprint tester. The system includes the same Ease of use GUI on its predecessor, the E9901D i307x system. Since the launch of the first Series 1 3070 test system, decades ago, the Transportability, Reliability and Stability (TRS) is maintained including the capability to test at low voltages that are required with today’s components.

Key Features & Specifications

• Short-wire fixturing technology ensures transportability, repeatability and stability

• Innovative design ensures easy maintenance and fixture change

• Compact chassis, saves 33% of floor space over conventional 3070 systems

• Single point of contact for your automated ICT solution

• Comprehensive in-system suite of boundary scan tools

• Full suite of award-winning Keysight ICT solutions

Description

The i3070 Series 5i retains the popular and proprietary Keysight short-wire fixturing technology used in our stalwart Keysight 3070 and i3070 systems.

Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.

Introducing our latest low-cost and digital-capable Medalist i1000D In-Circuit Test System

Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.

In addition, the mixed signal test mode is now available. Test strategies like digital to analog and analog to digital are now within reach of the i1000D. The mixed tests combine both the analog and digital test sources into a single file, allowing you to see both test source at the same time easily.

With its unique per pin programmable capability, the i1000D has improved its flexibility in supporting a new pin drive test mode. You can selectively control any digital resource on the tester for disabling or preconditioning pins. In short, the pin drive test mode gives you full control of the available digital drivers on the tester, without the need for a digital test library.

Description

TestSight Developer is the most cost effective CAD conversion solution in the market for Keysight Medalist i3070 and Medalist i1000. It offers fast and accurate CAD conversion, and supports numerous data formats such as GenCAM, GenCAD, HPGL; among many others.

Some of its features include design for test (DFT) analysis, probes placement, fixture plate design, bead probe design, and revision change analysis (Revision Management).

To learn more, request additional product information

• DFT Analysis is used to determine the suitability of a circuit board for In-Circuit test. It provides an instant evaluation of the percentage and spacing of all available probe targets on the circuit board. If probes are already placed, it generates a comprehensive list of probe coverage. If bead probes are used, DFT analysis evaluates the padstack design based on all relevant board data.

• Probes Placement matches a candidate target pad on the circuit board with the desired characteristics, for example: type, shape, size, drill size, access settings and mask relief. These characteristics can be programmed into a Macro that will automatically place probes based on the selected criteria, as well as minimum spacing requirements between probes.

• Revision Manager provides a layout and value change comparison between two board revisions. Revision manager can provide an instant analysis of whether an existing ICT fixture and test program can be adapted to work with a new circuit board revision, and help determine the necessary design changes.

• TestSight Bead Pro is the first software package to provide fully automatic bead probe placement and editing, as well as integrated Paste Stencil and Solder Mask design. TestSight Bead Pro conforms to the design rules specified in the Keysight Medalist Bead Probe Handbook, and provides accurate calculations for the Paste Stencil and Solder Mask size designs.

Keysight partners can help you achieve the best possible results from your test solution. Visit our CAD conversion solution partner.

Key Features & Specifications

• Smallest foot print inline automated ICT – 850 mm

• Upgradeable between inline and offline configurations

• Largest bottom side component clearance – 40 mm

• Special mechanism for test access on the board edge

• Integrated inline automated solution with Keysight’s worldwide support

Description

Unlike traditional bridge type board handlers that add a 3rd party equipment on your offline ICT systems, we provide a one-stop shopping experience when you are automating your in-circuit test.

Anticipating the cost dynamics in PCBA manufacturing, Keysight’s automated i1000D inline ICT helps you to accelerate production ramp up, while ensuring the quality of your products through some key unique features:

• The U9405A Keysight Medalist i1000D Small Foot Print is the smallest in-line automated ICT in the world at 850 mm in width.

• It comes with the most powerful digital test capabilities such as Boundary Scan, Cover-Extend Technology (CET), and Keysight’s well-known VTEP.

• This ICT platform that can be switched between inline and offline configurations, thus protecting your investment. Not only can the tester be upgraded, the test fixtures can also be re-used when you move to inline.

• The robust mechanical design makes it easy for you to maintain the system and achieve good uptime performance during production.

Key Features & Specifications

• Measures LED color in the 400-660nm range and intensity(luminosity) in μW/cm2

• Proprietary architecture will send digital stimuli, measure the LEDs’ color and intensity and returning results of up to 128 LEDs in less than 1.3 seconds

• One N1128A-001 LED Test Box can test up to 128 LEDs. A maximum of four N1128A-001 can be installed in one i3070 system(requires software Rel 8.3 and greater).

• Turns on multiple LEDs simultaneously using an i3070 patented unpowered digital test method

• Acquires the peak, base or instantaneous wavelengths of the LED color and returning the measurement in nanometers (nm)

• Uncompromising repeatability achieved through a shroud tube design to shield noise (ambient light) from surrounding LEDs

Description

• The i3070 LED Test Card delivers unparalleled performance inspecting up to 128 LEDs for color and luminosity in <1.3 seconds. The color and luminosity measurements are returned in nanometer and μW/cm2 units with accuracies of ±3nm and ±10% respectively.

• The LED Test Box interfaces between the i3070 system and the LED Test Sensors and Mux inside the test fixture. It connects to the i3070 via LAN and the test fixture through a magnetic connector.

Key Features & Specifications

The following ICT i3070 fixture accessories are available:

• Performance Port Bumpout

• TestJet Components

• Vectorless Test EP Items

• Personality Pins

• Offset Interface Pins

• Tapered Tooling Pins

• i3070 Fixture Alignment Plates